| [Research Result] Exhaustive and systematic accuracy verification and enhancement of STI stress compact model for general realistic layout patterns | 8/2/2010 | |
| [Research Result] Possible Origins of Extra Threshold Voltage Variability in N-Type Field-Effect Transistors by Intentionally Changing Process Conditions and Using Takeuchi plot | 7/20/2010 | |
| [Research Result] Flare Correction in EUV Lithography for half pitch 22nm | 7/12/2010 | |
| [Research Result] Analysis and Prospect of Local Variability of Drain Current in Scaled MOSFETs by a New Decomposition Method | 6/16/2010 |

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